z/OS DFSORT Application Programming Guide
Previous topic | Next topic | Contents | Contact z/OS | Library | PDF


Method 1: Bit operator tests

z/OS DFSORT Application Programming Guide
SC23-6878-00

This method of bit logic testing allows you to test whether selected bits in a binary field are all on, all off, in a mixed on-off state, or in selected combinations of these states. While this method allows you to test many different possible bit combinations with a single operation, similar to the Test Under Mask (TM) machine instruction, it is less suited to determine if a field contains exactly one particular combination of on and off bits than Method 2 described later in this section.

Go to the previous page Go to the next page




Copyright IBM Corporation 1990, 2014