The Performance Acceleration Module I group of diagnostics, also known as the IOmem diagnostics, tests the functioning of the Performance Acceleration Module I that is in your system. The IOmem diagnostic tests can generate error messages associated with the hardware, software, and user input.
The following table describes the IOmem test menu.
| Test no | Test | Description |
|---|---|---|
1 |
Comprehensive PAM I test |
Runs tests 2 through 8 in current mode. |
2 |
DMA Random data test |
Runs a random test pattern by writing to an entire region and performing a read and compare. |
3 |
DMA W/R Random data test |
Runs a random test pattern by writing to a 1 GB region and performing a read and compare before moving to the next 1GB region. |
4 |
DMA Write Random local read test Flag |
Tests memory with local DMA writes and a random data pattern. |
5 |
PIO 64 Write thenREad QuickCheck |
Writes a quick Programmed IO memory test to the first and last location on each page then performs a read and compare. |
6 |
DMA Bit Toggling test |
Test memory with a sequence of checkerboard (bit toggling) patterns. Select option 73 in this menue to define which tests are run. |
7 |
DMA local Write Step test |
Performs memory tests by way of the local DMA writes and the step function Data pattern. This test is useful in identifying address decoding issues. |
8 |
DMA local Write test |
Performs a memory test by way of local DMA writes. |
51 |
Show Configuration |
Displays all information about the card and anything on it. |
56 |
Show DIMM Log |
Displays the errors captured in the DIMM Log. |
58 |
Show Temp Sensors |
Display the sensor and FPGA temperature. |
59 |
Show DIMM |
Displays the DIMM size, part number, and serial number. |
62 |
Update FPGA [Xtnd only] |
Extended mode: Updates the Primary EEPROM. The new FPGA bits will be loaded after a reboot. |
63 |
Choose FPGA file |
Displays the contents of firmware directory and allows the uses the option to choose the FPGA file to load. |
64 |
Show FRU information |
Displays the module name, part number, serial number, and revision. |
66 |
Show ECC Stats and Summary |
Provides a summary of the ECC status. |
68 |
Show pass/fail status |
Provides a summary of the status. |
69 |
Toggle Training Flag |
By default, after each comprehensive test, the DMA controller is retrained. Use this option to enable or disable this feature. |
70 |
Toggle Voltage Margining |
By default, after each comprehensive test, the voltage margin is cycled. Use this option to enable or disable this feature. |
73 |
Set Bit Toggle Flag |
Use this option to control the pattern sequencing in option 6. |
74 |
Show memory |
Displays the memory contents. |
81 |
Set Address Range |
Sets the memory address range for subsequent tests. |
86 |
Toggle Show Summary Flag (global) |
Enables or disables the display of test summary information after each comprehensive loop. |
88 |
Set Comprehensive Test Mask (global) |
Enables the definition of which tests to be run in option 1. |
89 |
Set Detail Dump Options (global) |
Fills NVRAM memory with data patterns for power cycle test, which does burst reads. |
90 |
Memory card selection |
Enables the selection of a specific card for testing. |
91 |
Enable/disable looping |
Enables or disables continuous running of a diagnostic test. The test is stopped when Ctrl-C is pressed or when an error is encountered if option 92 is active. |
92 |
Stop/continue on error |
Starts or stops running a diagnostic test on an error. If looping is enabled, as set by option 91, looping continues after an error is encountered. |
93 |
Extended/normal test mode |
Enables or disables extended mode on tests where extended mode is an available option. |
93 |
Toggle detail mode |
Use this option to to define the amount of error information detail required. |
99 |
Exit |
Exits this diagnostics menu. |