ptychography

Under pressure: New ptychography technique examines stressed atoms in 3D

In a small lead hutch-protected chamber at Argonne National Labs is a nano-probe that bombards nano-sized electronic devices, like a transistor, for example, with x-rays. Think of it as a CT scan. But for atoms. It’s building a 3D model of that device’s atomic structure, for which we can examine the amount of strain it […]

Continue reading