IEDM

Advancing toward 7nm

This is the fourth of a four-part series about IBM featured papers at IEDM 2016. The annual International Electron Devices Meeting is “the world’s pre-eminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling.” So IBM researchers brought their scanning probe thermometer, their air spacer for […]

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Air spacers for 10nm chips

This is the third of a four-part series about IBM featured papers at IEDM 2016. The annual International Electron Devices Meeting is “the world’s pre-eminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling.” So IBM researchers brought their scanning probe thermometer, their air spacer for […]

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Another kind of chip with carbon nanotubes

This is the second of a four-part series about IBM featured papers at IEDM 2016. The annual International Electron Devices Meeting is “the world’s pre-eminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling.” So IBM researchers brought their scanning probe thermometer, their air spacer for […]

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Mapping hot spots at 10nm and below

This is the first of a four-part series about IBM featured papers at IEDM 2016. The annual International Electron Devices Meeting is “the world’s pre-eminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling.” So IBM researchers brought their scanning probe thermometer, their air spacer for […]

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