10nm

Air spacers for 10nm chips

This is the third of a four-part series about IBM featured papers at IEDM 2016. The annual International Electron Devices Meeting is “the world’s pre-eminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling.” So IBM researchers brought their scanning probe thermometer, their air spacer for […]

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Mapping hot spots at 10nm and below

This is the first of a four-part series about IBM featured papers at IEDM 2016. The annual International Electron Devices Meeting is “the world’s pre-eminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling.” So IBM researchers brought their scanning probe thermometer, their air spacer for […]

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Advancing semiconductor tech, one nanometer at a time

Dr. Griselda Bonilla is the senior manager of the Advanced BEOL Interconnect Technology team at IBM Research, responsible for delivering innovative solutions that advance IBM’s industry-leading, on-chip interconnect (BEOL) technologies. We sat down with her before her team gave two talks at the IITC/AMC Conference in San Jose, California this week. First off, tell us […]

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